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EC ENGR 297 SEM 1: New Zoom link - email@example.com - Google Apps for UCLA Mail
2020 Fall ECE 297: Graduate Seminar Series
. If the patterning fidelity is maintained near its present values of ~0.5 nm 3*sigma, it would triple fin width induced variability for 7nm FinFETs, and become more than ten-fold for nanowire transistors with 3nm design rules.
they become increasingly sensitive to geometry fluctuations
Transistor design for 5nm and beyond: Slowing down electrons to speed up transistors - IEEE Conference Publication